PDF Standards IEC 61280-2-2 Ed. 2.0 b:2005

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Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.

Product Details

Edition:

2.0

Published:

04/27/2005

Number of Pages:

51

File Size:

1 file , 1000 KB