PDF Standards IEC 60749-29 Ed. 2.0 b:2011

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IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing “no trouble found” (NTF) and “electrical overstress” (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
– a number of minor technical changes;
– the addition of two new annexes covering the testing of special pins and temperature calculations.

Product Details

Edition:

2.0

Published:

04/07/2011

Number of Pages:

48

File Size:

1 file , 680 KB

Note:

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