Electronics assembly technology – Part 4: Endurance test methods for solder joint of area array type package surface mount devices
standard by International Electrotechnical Commission, 10/09/2014

Amendment 1 – Low voltage surge protective devices – Part 21: Surge protective devices connected to telecommunications and signalling networks – Performance requirements and testing methods
Amendment by International Electrotechnical Commission, 04/25/2008

Precision clock synchronization protocol for networked measurement and control systems
standard by International Electrotechnical Commission, 09/16/2004

OPC unified architecture – Part 5: Information Model
standard by International Electrotechnical Commission, 10/18/2011

Audio recording – Minidisc system
standard by International Electrotechnical Commission, 06/16/2000

Electromechanical all-or-nothing relays – Part 52: Blank detail specification – Electromechanical all-or-nothing telecom relays of assessed quality – Two change-over contacts, 20 mm x 10 mm base
standard by International Electrotechnical Commission, 03/12/2002

Protection against lightning – Part 4: Electrical and electronic systems within structures
standard by International Electrotechnical Commission, 12/09/2010

Materials for printed boards and other interconnecting structures – Part 2-47: Reinforced base materials clad and unclad – Non-halogenated epoxide non-woven/woven E-glass reinforced laminate sheets of thermal conductivity 2,0 W/(m¿¿¿K) and defined flammability (vertical burning test), copper-clad fo
standard by International Electrotechnical Commission, 01/10/2018

Test methods for electrical materials, printed boards and other interconnection structures and assemblies – Part 2-719: Test methods for materials for interconnection structures – Relative permittivity and loss tangent (500 MHz to 10 GHz)
standard by International Electrotechnical Commission, 07/12/2016

Electromagnetic compatibility (EMC) – Part 4-8: Testing and measurement techniques – Power frequency magnetic field immunity test CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 03/28/2001