Semiconductor devices – Micro-electromechanical devices – Part 32: Test method for the nonlinear vibration of MEMS resonators
standard by International Electrotechnical Commission, 01/24/2019

Printed boards and printed board assemblies – Design and use – Part 7: Electronic component zero orientation for CAD library construction
standard by International Electrotechnical Commission, 04/10/2017

Reliability growth – Statistical test and estimation methods
standard by International Electrotechnical Commission, 03/24/2004

Nuclear power plants – Instrumentation and control systems – Requirements for coordinating safety and cybersecurity
standard by International Electrotechnical Commission, 10/28/2016

Multimedia systems and equipment – Multimedia e-publishing and e-books – Generic format for e-publishing
standard by International Electrotechnical Commission, 11/27/2013

Transformers, power supplies, reactors and similar products – EMC requirements
standard by International Electrotechnical Commission, 08/10/2017

Fibre optic interconnecting devices and passive components performance standard – Part 111-7: Sealed closures for category A – Aerial
standard by International Electrotechnical Commission, 11/10/2009

Amendment 1 – Live working – Voltage detectors – Part 1: Capacitive type to be used for voltages exceeding 1 kV a.c.
Amendment by International Electrotechnical Commission, 04/29/2009

Railway applications – Rolling stock – Onboard lithium-ion traction batteries
standard by International Electrotechnical Commission, 12/07/2017

Medical electrical equipment – Characteristics of digital X-ray imaging devices – Part 1-2: Determination of the detective quantum efficiency – Detectors used in mammography
standard by International Electrotechnical Commission, 06/05/2007