Reliability stress screening – Part 2: Electronic components
standard by International Electrotechnical Commission, 11/27/1998

Connectors for electronic equipment – Product requirements – Part 2-104: Circular connectors – Detail specification for circular connectors with M8 screw-locking or snap-locking
standard by International Electrotechnical Commission, 09/09/2014

Semiconductor devices – Flexible and stretchable semiconductor devices – Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
standard by International Electrotechnical Commission, 11/07/2018

Video surveillance systems for use in security applications – Part 2-2: Video transmission protocols – IP interoperability implementation based on HTTP and REST services
standard by International Electrotechnical Commission, 11/07/2013

3D Display devices – Part 12-1: Measuring methods for stereoscopic displays using glasses – Optical
standard by International Electrotechnical Commission, 01/09/2014

Structuring of technical information and documentation
standard by International Electrotechnical Commission, 04/18/2000

Specification for the testing of balanced and coaxial information technology cabling – Part 1: Installed balanced cabling as specified in ISO/IEC 11801 and related standards
standard by International Electrotechnical Commission, 09/26/2019

Superconductivity – Part 1: Critical current measurement – DC critical current of Nb-Ti composite superconductors
standard by International Electrotechnical Commission, 11/21/2006

Fibre optic interconnecting devices and passive components performance standard – Part 101-2: Fibre management systems for Category C – Controlled environment
standard by International Electrotechnical Commission, 09/27/2006

Electronic design interchange format (EDIF) – Part 2: Version 4 0 0. (This publication is available in electronic HTML format only)
standard by International Electrotechnical Commission, 01/31/2000