PDF Standards IEC 62766-2-1 Ed. 1.0 b:2016
Consumer terminal function for access to IPTV and open internet multimedia services – Part 2-1: Media formats
standard by International Electrotechnical Commission, 12/14/2016
Consumer terminal function for access to IPTV and open internet multimedia services – Part 2-1: Media formats
standard by International Electrotechnical Commission, 12/14/2016
Field device tool (FDT) interface specification – Part 301:Communication profile integration – IEC 61784 CPF 1 CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 05/13/2016
Maritime navigation and radiocommunication equipment and systems – Automatic identification system (AIS) – Part 2: AIS AtoN Stations – Operational and performance requirements, methods of testing and required test results
standard by International Electrotechnical Commission, 03/26/2008
Fibre optic active components and devices – Performance standards – Part 9: Seeded reflective semiconductor optical amplifier transceivers
standard by International Electrotechnical Commission, 04/24/2014
Electrical safety in low voltage distribution systems up to 1 000 V a.c. and 1 500 V d.c. – Equipment for testing, measuring or monitoring of protective measures – Part 12: Performance measuring and monitoring devices (PMD)
standard by International Electrotechnical Commission, 08/15/2007
Control systems in the process industry – Electrical and instrumentation loop check
standard by International Electrotechnical Commission, 11/08/2012
Maritime navigation and radiocommunication equipment and systems – Automatic identification system (AIS) – Part 1: AIS Base Stations – Minimum operational and performance requirements, methods of testing and required test results
standard by International Electrotechnical Commission, 01/20/2015
Energy management system application program interface (EMS-API) – Part 404: High Speed Data Access (HSDA)
standard by International Electrotechnical Commission, 08/10/2007
Household range hoods – Methods for measuring performance CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 11/23/2005
Semiconductor devices – Metallization stress void test
standard by International Electrotechnical Commission, 04/22/2010