Semiconductor devices – Discrete devices – Part 4: Microwave diodes and transistors
standard by International Electrotechnical Commission, 08/23/2007

Uninterruptible power systems (UPS) – Part 3: Method of specifying the performance and test requirements
standard by International Electrotechnical Commission, 03/14/2011

Electric components – Reliability – Reference conditions for failure rates and stress models for conversion
standard by International Electrotechnical Commission, 06/24/2011

Electricity metering data exchange – The DLMS/COSEM suite – Part 6-2: COSEM interface classes
standard by International Electrotechnical Commission, 09/06/2017

Nuclear power plants – Instrumentation important to safety – Determination and maintenance of trip setpoints
standard by International Electrotechnical Commission, 08/20/2002

Medical device software – Software life cycle processes
standard by International Electrotechnical Commission, 05/09/2006

Batch control – Part 1: Models and terminology
standard by International Electrotechnical Commission, 08/26/1997

Digital addressable lighting interface – Part 203: Particular requirements for control gear – Discharge lamps (excluding fluorescent lamps) (device type 2)
standard by International Electrotechnical Commission, 06/09/2009

Integrated circuits – Measurement of electromagnetic immunity – Part 8: Measurement of radiated immunity – IC stripline method
standard by International Electrotechnical Commission, 07/06/2012

Maritime navigation and radiocommunication equipment and systems – Integrated navigation systems – Part 2: Modular structure for INS – Operational and performance requirements, methods of testing and required test results
standard by International Electrotechnical Commission, 12/05/2012