Railway applications – Rolling stock equipment – Shock and vibration tests
standard by International Electrotechnical Commission, 01/07/1999

Connectors for electronic equipment – Product requirements – Part 7-100: Cable outlet accessories – Detail specification for a metric cable sealing consisting of an integrated part of heavy-duty rectangular or circular connector hoods and a sealing system
standard by International Electrotechnical Commission, 05/23/2006

Semiconductor devices – Mechanical and climatic test methods – Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
standard by International Electrotechnical Commission, 12/09/2008

Semiconductor devices – Part 1: General
standard by International Electrotechnical Commission, 02/21/2006

Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 3-32: Examinations and measurements – Polarization mode dispersion measurement for passive optical components
standard by International Electrotechnical Commission, 08/28/2006

Test methods for electrical materials, interconnection structures and assemblies – Part 1: General test methods and methodology CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 11/22/2001

Amendment 5 – Single-capped fluorescent lamps – Performance specifications
Amendment by International Electrotechnical Commission, 11/23/2011

Instrument transformers – Part 15: Additional requirements for voltage transformers for DC applications
standard by International Electrotechnical Commission, 07/17/2018

Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 3-6: Examinations and measurements – Return loss
standard by International Electrotechnical Commission, 12/09/2008

Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 3-3: Examinations and measurements – Active monitoring of changes in attenuation and return loss
standard by International Electrotechnical Commission, 03/10/2009