Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 3-32: Examinations and measurements – Polarization mode dispersion measurement for passive optical components
standard by International Electrotechnical Commission, 08/28/2006
Test methods for electrical materials, interconnection structures and assemblies – Part 1: General test methods and methodology CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 11/22/2001
Semiconductor devices – Integrated circuits – Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits – Section 1: Requirements for internal visual examination
standard by International Electrotechnical Commission, 03/01/1994
Ultrasonics – Hydrophones – Part 2: Calibration for ultrasonic fields up to 40 MHz
standard by International Electrotechnical Commission, 08/23/2007
Semiconductor devices – Micro-electromechanical devices – Part 33: MEMS piezoresistive pressure-sensitive device
standard by International Electrotechnical Commission, 04/05/2019
Cores made of soft magnetic materials – Measuring methods – Part 3: Magnetic properties at high excitation level
standard by International Electrotechnical Commission, 12/21/2000
Instrument transformers – Part 15: Additional requirements for voltage transformers for DC applications
standard by International Electrotechnical Commission, 07/17/2018
Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 3-6: Examinations and measurements – Return loss
standard by International Electrotechnical Commission, 12/09/2008
Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 3-3: Examinations and measurements – Active monitoring of changes in attenuation and return loss
standard by International Electrotechnical Commission, 03/10/2009
Industrial communication networks – Fieldbus specifications – Part 5-23: Application layer service definition – Type 23 elements
standard by International Electrotechnical Commission, 08/18/2014
