Semiconductor devices – Mechanical and climatic test methods – Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)
standard by International Electrotechnical Commission, 04/23/2013
Semiconductor devices – Discrete devices – Part 4: Microwave devices CONSOLIDATED EDITION CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 09/26/2001
Semiconductor devices – Part 16-3: Microwave integrated circuits – Frequency converters CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 08/16/2019
Automatic electrical controls – Part 2-6: Particular requirements for automatic electrical pressure sensing controls including mechanical requirements
standard by International Electrotechnical Commission, 04/22/2015
Fibre optic active components and devices – Performance standards – Part 5: ATM-PON transceivers with LD driver and CDR ICs
standard by International Electrotechnical Commission, 08/11/2009
Methods of measurement for minidisc recorders/players
standard by International Electrotechnical Commission, 10/18/2001
Radio-frequency connectors – Part 29: Sectional specification – Miniature radio frequency coaxial connectors model screw, snap-on, push-pull or quick-lock, slide-in (rack and panel applications) – Characteristic impedance 50 ¿¿ (type 1,0/2,3) – 50 ¿¿ and 75 ¿¿ applications
standard by International Electrotechnical Commission, 06/23/2005
Electromagnetic compatibility (EMC) – Part 4-18: Testing and measurement techniques – Damped oscillatory wave immunity test
standard by International Electrotechnical Commission, 05/16/2019
Medical electrical equipment – Part 2-8: Particular requirements forthe basic safety and essential performance of therapeutic X-ray equipment operating in the range 10 kV to 1 MV CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 09/29/2015
Consumer audio/video equipment – Digital interface – Part 8: Transmission of ITU-R BT.601 style digital video data
standard by International Electrotechnical Commission, 11/26/2008
