Compression and mechanical connectors for power cables – Part 1-2: Test methods and requirements for insulation piercing connectors for power cables for rated voltages up to 1 kV (U<sub>m</sub> = 1,2 kV) tested on insulated conductors
standard by International Electrotechnical Commission, 05/08/2018
Semiconductor devices – Part 16-1: Microwave integrated circuits – Amplifiers
standard by International Electrotechnical Commission, 11/20/2001
Guide for the statistical analysis of ageing test data – Part 1: Methods based on mean values of normally distributed test results
standard by International Electrotechnical Commission, 12/14/2011
Fixed capacitors for use in electronic equipment – Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c. capacitors
standard by International Electrotechnical Commission, 11/09/2005
Plugs, socket-outlets and couplers for industrial purposes – Part 4: Switched socket-outlets and connectors with or without interlock CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 04/27/2012
Industrial-process control systems – Methods of evaluating the performance of valve positioners with pneumatic outputs
standard by International Electrotechnical Commission, 04/28/2000
Fibre optic communication subsystem tets procedures – Part 2-3: Digital systems – Jitter and wander measurements
standard by International Electrotechnical Commission, 07/14/2009
Expression of performance of sample handling systems for process analyzers
standard by International Electrotechnical Commission, 03/15/1992
Photovoltaic devices – ALL PARTS
standard by International Electrotechnical Commission, 05/18/2017
Insulators for overhead lines with a nominal voltage above 1000 V – Part 1: Ceramic or glass insulator units for a.c. systems – Definitions, test methods and acceptance criteria
standard by International Electrotechnical Commission, 04/26/1993
