Semiconductor devices – Discrete devices – Part 5-4: Optoelectronic devices – Semiconductor lasers
standard by International Electrotechnical Commission, 02/23/2006

Industrial-process control valves – Part 2-3: Flow capacity – Test procedures
standard by International Electrotechnical Commission, 12/22/1997

Specifications for particular types of winding wires – Part 0-7: General requirements – Fully insulated (FIW) zero-defect enamelled round copper wire with nominal conductor diameter of 0,040 mm to 1,600 mm
standard by International Electrotechnical Commission, 04/19/2012

Electrostatics – Part 5-2: Protection of electronic devices from electrostatic phenomena – User guide
standard by International Electrotechnical Commission, 08/14/2007

Cable networks for television signals, sound signals and interactive services – Part 6: Optical equipment
standard by International Electrotechnical Commission, 07/31/2003

Potentiometers for use in electronic equipment – Part 1: Generic specification
standard by International Electrotechnical Commission, 05/14/2008

Household and similar electrical appliances – Safety – Part 2-56:Particular requirements for projectors and similar appliances CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 08/12/2014

Nuclear power plants – Control rooms – Operator controls
standard by International Electrotechnical Commission, 04/29/2008

Low-voltage switchgear and controlgear assemblies – Part 4: Particular requirements for assemblies for construction sites (ACS)
standard by International Electrotechnical Commission, 11/15/2012

Portable, transportable or installed X or gamma radiation ratemeters for environmental monitoring – Part 1: Ratemeters
standard by International Electrotechnical Commission, 04/30/1991