Alarm and electronic security systems – Part 11-31: Electronic access control systems – Core interoperability protocol based on Web services
standard by International Electrotechnical Commission, 11/24/2016
Semiconductor devices – Mechanical and climatic test methods – Part 29: Latch-up test
standard by International Electrotechnical Commission, 04/07/2011
Miniature fuses – Part 6: Fuse-holders for miniature cartridge fuse-links
standard by International Electrotechnical Commission, 04/25/1994
Safety requirements for electrical equipment for measurement, control, and laboratory use – Part 2-033: Particular requirements for hand-held multimeters and other meters for domestic and professional use, capable of measuring mains voltage
standard by International Electrotechnical Commission, 06/21/2019
Semiconductor devices. Integrated circuits – Part 2: Digital integrated circuits – Section seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories
standard by International Electrotechnical Commission, 10/23/1992
Methods for the determination of the dielectric properties of insulating materials at frequencies above 300 MHz. Part 2: Resonance methods
standard by International Electrotechnical Commission, 01/01/1977
Environmental testing – Part 2-57: Tests – Test Ff: Vibration – Time-history method
standard by International Electrotechnical Commission, 11/18/1999
Helical-scan digital component video cassette recording system using 19 mm magnetic tape (format D-1)
standard by International Electrotechnical Commission, 12/31/1989
Classification of environmental conditions – Part 3-7: Classification of groups of environmental parameters and their severities – Portable and non-stationary use CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 10/24/2002
Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
standard by International Electrotechnical Commission, 01/01/1976
