Semiconductor devices – Mechanical and climatic test methods – Part 29: Latch-up test
standard by International Electrotechnical Commission, 04/07/2011

Evaluation and qualification of electrical insulation systems
standard by International Electrotechnical Commission, 10/27/2004

Guide for the statistical analysis of ageing test data. Part 1: Methods based on mean values of normally distributed test results
standard by International Electrotechnical Commission, 01/01/1974

Fixed capacitors for use in electronic equipment – Part 1: Generic specification
standard by International Electrotechnical Commission, 03/16/1999

Miniature fuses – Part 6: Fuse-holders for miniature cartridge fuse-links
standard by International Electrotechnical Commission, 04/25/1994

Safety requirements for electrical equipment for measurement, control, and laboratory use – Part 2-033: Particular requirements for hand-held multimeters and other meters for domestic and professional use, capable of measuring mains voltage
standard by International Electrotechnical Commission, 06/21/2019

Semiconductor devices. Integrated circuits – Part 2: Digital integrated circuits – Section seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories
standard by International Electrotechnical Commission, 10/23/1992

Household and similar electrical appliances – Safety – Part 2-17: Particular requirements for blankets, pads, clothing and similar flexible heating appliances CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 10/14/2009

Rubber insulated cables – Rated voltages up to and including 450/750 V – Part 8: Cords for applications requiring high flexibility CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 01/29/2004

Printed boards – Electronic data description and transfer – Part 1: Printed board description in digital form
standard by International Electrotechnical Commission, 09/09/1994