PDF Standards IEC 60747-7 Ed. 2.0 b:2000
Semiconductor discrete devices and integrated circuits – Part 7: Bipolar transistors
standard by International Electrotechnical Commission, 12/21/2000
Semiconductor discrete devices and integrated circuits – Part 7: Bipolar transistors
standard by International Electrotechnical Commission, 12/21/2000
Power cables with extruded insulation and their accessories for rated voltages from 1 kV (Um = 1,2 kV) up to 30 kV (Um = 36 kV) – Part 2: Cables for rated voltages from 6 kV (Um = 7,2 kV) up to 30 kV (Um = 36 kV)
standard by International Electrotechnical Commission, 03/08/2005
Appliance couplers for household and similar general purposes – Part 2-3: Appliance couplers with a degree of protection higher than IPX0 CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 01/24/2005
Radiation protection instrumentation – Installed ambient dose equivalent rate meters, warning and monitoring assemblies for neutrons with energies from thermal to 20 MeV
standard by International Electrotechnical Commission, 01/10/2020
Radio-frequency connectors – Part 40: Sectional specification for 2.4 series RF connectors
standard by International Electrotechnical Commission, 11/29/2010
Acoustics – Measurement of airborne noise emitted by steam turbines and driven machinery
standard by International Electrotechnical Commission, 04/22/1991
Cable networks for television signals, sound signals and interactive services – Part 101: System performance of forward paths loaded with digital channels only
standard by International Electrotechnical Commission, 04/27/2016
Fire hazard testing – Part 6-2: Smoke obscuration – Summary and relevance of test methods
standard by International Electrotechnical Commission, 06/05/2018
Piezoelectric ceramic resonator units – Part 2: Guide to the use of piezoelectric ceramic resonator units
standard by International Electrotechnical Commission, 02/08/1994
Vaccum cleaners for household use – Methods of measuring the performance CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 05/27/2004