Flanges for waveguides – Part 4: Relevant specifications for flanges for circular waveguides
standard by International Electrotechnical Commission, 03/22/2017

Electrical apparatus for explosive gas atmospheres – Part 14: Electrical installations in hazardous areas (other than mines)
standard by International Electrotechnical Commission, 10/24/2002

Semiconductor devices – Part 14-11: Semiconductor sensors – Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
standard by International Electrotechnical Commission, 03/03/2021

International Electrotechnical Vocabulary (IEV) – Part 371: Telecontrol
standard by International Electrotechnical Commission, 11/30/1984

Display lighting unit – Part 2-4: Electro-optical measuring methods of laser module
standard by International Electrotechnical Commission, 09/29/2020

Integrated Circuits – EMC Evaluation Of Transceivers – Part 5: Ethernet Transceivers
standard by International Electrotechnical Commission, 04/01/2021

Amendment 1 – Electromagnetic compatibility (EMC) – Part 4-7: Testing and measurement techniques – General guide on harmonics and interharmonics measurements and instrumentation, for power supply systems and equipment connected thereto
Amendment by International Electrotechnical Commission, 06/11/2008

DC supplied electronic ballasts for tubular fluorescent lamps – Performance requirements CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 08/20/2001

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
standard by International Electrotechnical Commission, 11/27/2008

Method for the determination of the proof and the comparative tracking indices of solid insulating materials
standard by International Electrotechnical Commission, 01/17/2003