PDF Standards IEC 60749-29 Ed. 1.0 b:2003

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Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing “”No Trouble Found”” and “”Electrical Overstress”” failures due to latch-up.

Product Details

Edition:

1.0

Published:

11/04/2003

Number of Pages:

41

File Size:

1 file , 920 KB