PDF Standards IEC 62374 Ed. 1.0 b:2007

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Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

Product Details

Edition:

1.0

Published:

03/29/2007

Number of Pages:

43

File Size:

1 file , 720 KB

Note:

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